1. What are the false and multicycle paths ?
2. For at speed patterns : What addtional care need to be taken in terms of timing exceptions while doing at speed testing ?
3. What are the traditional methods to counteract against the false and multicycle paths for the at speed testing ?
4. What is the new method for the at speed patterns creation with timing exceptions ?
5. Why are the Cutpoints added for ASST?
6. Can you explain on-Product clock generation circuitry ?
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